ASPECT & NEO Analyser & Control Suite
Key Features
- Fast Survey Spectrum in 2 Seconds
- Peak Monitoring in Real Time
- Snapshot Capability with 128 Multi-Channel Detector
- Energy Range Up To 3.5 KeV
- NEO Control Suite
Related products
The ASPECT hemispherical energy analyser with a mean radius of 160 mm and a true counting multi-channel detector features high transmission, fast spectrometer electronics with short voltage settling times and fast detector read-out.
SIGMA's ASPECT analyser and MECS and LAX X-ray sources are fully integrated within NEO which enables full control of the instruments with easy-to-use calibration and conditioning routines.
Automated sequences with fast and dynamic acquisition modes, a unique data library with user-friendly interface structure and extensive search functionality, along with powerful data processing tools make NEO the leading control suite for ESCA applications.
A range of other optional sources are available for further analysis and preparation methods.
